Reflection Image Model for Micro-ellipsometer

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dc.contributor.authorWeerayuth Khunrattanasiri
dc.contributor.authorSiridech Boonsang
dc.date.accessioned2025-07-21T06:01:56Z
dc.date.issued2019-07-01
dc.identifier.doi10.1109/ecti-con47248.2019.8955436
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/8554
dc.subjectEllipsometry
dc.subjectReflection
dc.subjectImage plane
dc.subject.classificationOptical Coatings and Gratings
dc.titleReflection Image Model for Micro-ellipsometer
dc.typeArticle

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