Low leakage current Ni/CdZnTe/In diodes for X/<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" id="mml1" display="inline" overflow="scroll" altimg="si1.gif"><mml:mi mathvariant="normal">_</mml:mi></mml:math>-ray detectors

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dc.contributor.authorV.M. Sklyarchuk
dc.contributor.authorV.A. Gnatyuk
dc.contributor.authorW. Pecharapa
dc.date.accessioned2025-07-21T05:58:50Z
dc.date.issued2017-10-16
dc.identifier.doi10.1016/j.nima.2017.10.016
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/6805
dc.subjectBiasing
dc.subjectLeakage (economics)
dc.subjectDepletion region
dc.subjectReverse leakage current
dc.subject.classificationAdvanced Semiconductor Detectors and Materials
dc.titleLow leakage current Ni/CdZnTe/In diodes for X/<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" id="mml1" display="inline" overflow="scroll" altimg="si1.gif"><mml:mi mathvariant="normal">_</mml:mi></mml:math>-ray detectors
dc.typeArticle

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