Multiresolution image alignment based on discrete wavelet transform

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dc.contributor.authorLohakan, M.
dc.contributor.authorNantivatana, P.
dc.contributor.authorNarkbuakaew, W.
dc.contributor.authorPintaviroj, C.
dc.contributor.authorSangworasil, M.
dc.date.accessioned2026-08-06T09:53:00Z
dc.date.available2026-08-06T09:53:00Z
dc.date.issued2005-01-01
dc.description.abstractWe introduce a multi-resolution image registration based on using discrete wavelet transform. We first extract contour from both images that we want to align. The extracted contours are then fitted with B-spline curve representation to synthesize the new contours with equal number of point. The area parameter is used in the B-spline fitting to make the new generated curve immune to affine transformation. Before representing the B-spline contour with discrete wavelet transform, the problem of starting point of the contour needs to be handle. This can be done by computing the maximum curvature. The maximum curvature is selected as the starting point. Once the starting points on the contour have been established, the discrete wavelet transform is then recursively represented the contours until only a few points are remained. Due to the affine-invariant properties of discrete wavelet transform, these points can be used as landmark points for registering the transformed contour with the original contour. The experiments have shown that the purposed methods are robust and promising even in the presence of noise.
dc.identifier.citationIEEE Region 10 Annual International Conference Proceedings TENCON, 2007, 2005
dc.identifier.doi10.1109/TENCON.2005.301093
dc.identifier.issn21593442
dc.identifier.other2-s2.0-34249324797
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/973
dc.sourceIEEE Region 10 Annual International Conference Proceedings TENCON
dc.subjectAffine invariant
dc.subjectDiscrete wavelet transform
dc.subjectImage registration
dc.titleMultiresolution image alignment based on discrete wavelet transform
dc.typeConference Paper

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