Apparatus for Inspection of Low-Coercivity Magnetic Force Microscopy Tips

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dc.contributor.authorBadin Damrongsak
dc.contributor.authorWorachote Photaram
dc.contributor.authorKarnt Saengkaew
dc.contributor.authorIttipon Cheowanish
dc.contributor.authorPattareeya Damrongsak
dc.date.accessioned2025-07-21T06:00:08Z
dc.date.issued2018-07-01
dc.identifier.doi10.1109/iceast.2018.8434451
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/7546
dc.subjectSolenoid
dc.subject.classificationForce Microscopy Techniques and Applications
dc.titleApparatus for Inspection of Low-Coercivity Magnetic Force Microscopy Tips
dc.typeArticle

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