Single-Frequency Sensor for Thick Rind Fruit Quality Assessment

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dc.contributor.authorLeekul, Prapan
dc.contributor.authorDao, Hoang Nam
dc.contributor.authorSirisuk, Phaophak
dc.contributor.authorPhongcharoenpanich, Chuwong
dc.contributor.authorKrairiksh, Monai
dc.date.accessioned2026-08-06T10:50:04Z
dc.date.available2026-08-06T10:50:04Z
dc.date.issued2025-01-01
dc.description.abstractA sensor capable of estimating the dielectric properties of the outer and inner materials of a concentric dielectric sphere is essential for assessing the quality of thick rind fruits. This article presents a sensor design that operates at a single frequency and is straightforward. The underlying principle of the sensor involves transmitting a microwave signal to a concentric dielectric sphere with two power levels. The low-power signal yields backscattered waves from the outer sphere, while the high-power signal provides information about backscattered waves from both the outer and inner spheres. The sensor, which operates at a frequency of 10 GHz using cost-effective components, effectively detects defects in spherical-shaped fruits, e.g., mangosteens. The accuracy in classifying translucent mangosteens from normal mangosteens is 92.5%, enabling effective classification of defected fruits.
dc.identifier.citationIEEE Sensors Journal, 25(12), 21535-21545, 2025
dc.identifier.doi10.1109/JSEN.2025.3566117
dc.identifier.issn1530437X
dc.identifier.other2-s2.0-105004763528
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/16687
dc.sourceIEEE Sensors Journal
dc.subjectMicrowave sensor
dc.subjectsingle-frequency sensor
dc.subjectthick rind fruit
dc.subjecttwo power levels
dc.titleSingle-Frequency Sensor for Thick Rind Fruit Quality Assessment
dc.typeArticle

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