Surface morphology and wettability for thin films of beta-iron disilicide produced through direct-current sputtering utilizing a pair of facing targets

dc.contributor.authorPeerasil Charoenyuenyao
dc.contributor.authorNathaporn Promros
dc.contributor.authorRawiwan Chaleawpong
dc.contributor.authorTsuyoshi Yoshitake
dc.date.accessioned2025-07-21T05:59:27Z
dc.date.issued2018-01-01
dc.description.abstractIn the current work, beta-FeSi2 films were epitaxially produced onto Si(111) wafer substrates via usage of facing-targets direct-current sputtering (FTDCS). The temperature for substrate heating was maintained at 600 °C and the sputtering pressure was set at 1.33 × 10 -1 Pa. The surface morphology and contact angles of the beta-FeSi 2 films were explored consistently in this research. Images of three-dimensional AFM and FESEM for the beta-FeSi2 film surface revealed a smooth surface with a root mean square roughness of 1.31 nm and a porous area. The average contact angle between the dropped water and beta-FeSi 2 film surface was found to be 98.7°, establishing that the surface of the beta-FeSi 2 films was hydrophobic. The acquired experimental results revealed the commencement of the hydrophobic surface feature of the beta-FeSi 2 films produced via FTDCS approach.
dc.identifier.doi10.1051/matecconf/201819201054
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/7187
dc.subjectMorphology
dc.subjectBETA (programming language)
dc.subjectRoot mean square
dc.subject.classificationSemiconductor materials and interfaces
dc.titleSurface morphology and wettability for thin films of beta-iron disilicide produced through direct-current sputtering utilizing a pair of facing targets
dc.typeArticle

Files

Collections