The Effect of Surface Leakage Current on Frequency Domain Spectroscopy of 22 kV OIP Bushing

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dc.contributor.authorWarisanan Rojanasunan
dc.contributor.authorKomin Chumpiboon
dc.contributor.authorPatt Udomluksananon
dc.contributor.authorSiwakorn Jeenmuang
dc.contributor.authorPhop Chancharoensook
dc.contributor.authorNorasage Pattanadech
dc.date.accessioned2025-07-21T06:11:51Z
dc.date.issued2024-08-04
dc.identifier.doi10.1109/icpadm61663.2024.10750667
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/13844
dc.subjectBushing
dc.subjectLeakage (economics)
dc.subject.classificationPower Transformer Diagnostics and Insulation
dc.titleThe Effect of Surface Leakage Current on Frequency Domain Spectroscopy of 22 kV OIP Bushing
dc.typeArticle

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