Insights into the properties and possible bonding states of radiofrequency-magnetron-sputtered indium tin oxide thin films acquired using ultraviolet–visible spectroscopy data for cost-effective material characterization

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dc.contributor.authorS. Tipawan Khlayboonme
dc.date.accessioned2026-05-08T19:18:07Z
dc.date.issued2023-11-2
dc.identifier.doi10.1016/j.optmat.2023.114523
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/16369
dc.publisherOptical Materials
dc.subjectZnO doping and properties
dc.subjectChalcogenide Semiconductor Thin Films
dc.subjectTransition Metal Oxide Nanomaterials
dc.titleInsights into the properties and possible bonding states of radiofrequency-magnetron-sputtered indium tin oxide thin films acquired using ultraviolet–visible spectroscopy data for cost-effective material characterization
dc.typeArticle

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