Detection of leaf apex and base by using contour and symmetry analysis

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dc.contributor.authorUkrit Watchareeruetai
dc.contributor.authorMatchima Ditthawibun
dc.contributor.authorKriangkrai Phanjan
dc.date.accessioned2025-07-21T05:56:24Z
dc.date.issued2015-11-01
dc.identifier.doi10.1109/icsec.2015.7401441
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/5445
dc.subjectApex (geometry)
dc.subjectBase (topology)
dc.subject.classificationIndustrial Vision Systems and Defect Detection
dc.titleDetection of leaf apex and base by using contour and symmetry analysis
dc.typeArticle

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