Degradation in electrical properties of Si-PIN Power diodes after treatment by electron irradiation

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dc.contributor.authorWiwat Itthikusumarn
dc.contributor.authorJirawat Prabket
dc.contributor.authorAmporn Poyai
dc.date.accessioned2025-07-21T05:54:07Z
dc.date.issued2013-09-01
dc.identifier.doi10.1109/iscit.2013.6645876
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/4134
dc.subjectSaturation current
dc.subjectElectron beam processing
dc.subjectDegradation
dc.subjectReverse leakage current
dc.subjectPIN diode
dc.subject.classificationIntegrated Circuits and Semiconductor Failure Analysis
dc.titleDegradation in electrical properties of Si-PIN Power diodes after treatment by electron irradiation
dc.typeArticle

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