A new simultaneous conducted electromagnetic interference measuring and testing device

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dc.contributor.authorD. Sakulhirirak
dc.contributor.authorV. Tarateeraseth
dc.contributor.authorW. Khan-ngern
dc.contributor.authorN. Yoothanom
dc.date.accessioned2025-07-21T05:49:37Z
dc.date.issued2008-05-01
dc.identifier.doi10.1109/apemc.2008.4559948
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/1592
dc.subjectElectromagnetic Compatibility
dc.subjectConducted electromagnetic interference
dc.subjectCommon-mode signal
dc.subjectLine (geometry)
dc.subjectSeparation (statistics)
dc.subject.classificationElectromagnetic Compatibility and Noise Suppression
dc.titleA new simultaneous conducted electromagnetic interference measuring and testing device
dc.typeArticle

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