An interferometric back focal plane microellipsometry for the determination of optical properties of a slider's air bearing surface

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dc.contributor.authorWeerayuth Khunrattanasiri
dc.contributor.authorSiridech Boonsang
dc.date.accessioned2025-07-21T05:55:25Z
dc.date.issued2014-12-01
dc.identifier.doi10.1109/apsipa.2014.7041800
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/4897
dc.subjectReflection
dc.subject.classificationOptical measurement and interference techniques
dc.titleAn interferometric back focal plane microellipsometry for the determination of optical properties of a slider's air bearing surface
dc.typeArticle

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