Free Layer Characterization of TMR Head with Multi-Stripe Height by Using Ferro Magnetic Resonance Analyzer (FMRA)

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dc.contributor.authorP. Weawhongse
dc.contributor.authorChiranut Sa-Ngiamsak
dc.contributor.authorWanchai Pijitrojana
dc.contributor.authorKasin Vichienchom
dc.date.accessioned2025-07-21T05:56:06Z
dc.date.issued2015-08-01
dc.identifier.doi10.4028/www.scientific.net/amm.781.195
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/5284
dc.subjectResistive touchscreen
dc.subject.classificationMagnetic properties of thin films
dc.titleFree Layer Characterization of TMR Head with Multi-Stripe Height by Using Ferro Magnetic Resonance Analyzer (FMRA)
dc.typeArticle

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