Unrepeated of Test Tap Capacitance New RIP Bushings

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dc.contributor.authorSuthat Suksagoolpanya
dc.contributor.authorNorasage Pattanadech
dc.date.accessioned2025-07-21T06:05:03Z
dc.date.issued2021-04-01
dc.identifier.doi10.1109/iceast52143.2021.9426311
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/10254
dc.subjectBushing
dc.subjectLeakage (economics)
dc.subject.classificationHigh voltage insulation and dielectric phenomena
dc.titleUnrepeated of Test Tap Capacitance New RIP Bushings
dc.typeArticle

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