Dynamic measurement of thin liquid film parameters using high-speed ellipsometry

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dc.contributor.authorP.V.P. Yupapin
dc.contributor.authorR. Chitaree
dc.contributor.authorA.W. Palmer
dc.contributor.authorK.T.V. Grattan
dc.contributor.authorK. Weir
dc.date.accessioned2025-07-21T05:46:57Z
dc.date.issued1998-02-01
dc.identifier.doi10.1016/s0924-4247(97)01642-7
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/114
dc.subjectEllipsometry
dc.subjectFresnel equations
dc.subjectReflection
dc.subject.classificationOptical Polarization and Ellipsometry
dc.titleDynamic measurement of thin liquid film parameters using high-speed ellipsometry
dc.typeArticle

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