Dielectric Relaxation and Microstructures of SnO2 Doped CaCu3Ti4O12 Electroceramics Prepared Via Vibro-milling Method
| dc.contributor.author | Makcharoen, Worawut | |
| dc.contributor.author | Punsawat, Woratat | |
| dc.date.accessioned | 2026-08-06T10:15:20Z | |
| dc.date.available | 2026-08-06T10:15:20Z | |
| dc.date.issued | 2017-01-01 | |
| dc.description.abstract | High dielectric constant CaCu<inf>3</inf>Ti<inf>4</inf>O<inf>12</inf> (CCTO) is a compound with a high dielectric constant, but it has a high loss tangent at room temperature. This research aims to study on the dielectric properties and loss tangent of SnO<inf>2</inf> doped CaCu<inf>3</inf>Ti<inf>4</inf>O<inf>12</inf> (CCTO) ceramics were investigated. The ceramic samples of SnO<inf>2</inf> doping CCTO were prepared by a solid-state reaction method. The characterization of the samples was carried out using scanning electron microscopy (SEM) and x-ray diffraction (XRD). The conventional solid-state reaction was employed. The metal oxide powders were mixed using a vibratory milling for 6 hour and sintered at 1000°C for 4 hour. The phase formation of the calcined powders and sintered ceramics was examined by X-ray diffraction technique (XRD). Microstructure was examined by scanning electron microscopy (SEM). SnO<inf>2</inf> doping produced a notable decrease in grain size. Average values of grain size, as measured by the linear intercept method. The dielectric measurements at room temperature to 130°C, in the frequency range 100 Hz- 500 kHz. The XRD result a CCTO structure does not changes on Sn doped samples. The results show the loss tangent at room temperature and at 100 kHz decreased from 0.14 for the 0 mol% Sn doped CCTO sample to 0.04 for the 2.0 mol% Sn doped sample while at 500 kHz, it was decreased from 0.2 for the undoped CCTO sample to 0.04 for the 2.0 mol% Sn doped sample. However, the lowest loss tangent was 0.02 at 500 kHz and at 65°C and show a stable loss tangent in temperature range 25 - 130°C. | |
| dc.identifier.citation | Materials Today Proceedings, 4(5), 6234-6238, 2017 | |
| dc.identifier.doi | 10.1016/j.matpr.2017.06.121 | |
| dc.identifier.issn | 22147853 | |
| dc.identifier.other | 2-s2.0-85028446150 | |
| dc.identifier.uri | https://dspace.kmitl.ac.th/handle/123456789/7284 | |
| dc.source | Materials Today Proceedings | |
| dc.subject | CCTO | |
| dc.subject | Dielectric properties | |
| dc.subject | Doping | |
| dc.subject | Perovskite structure | |
| dc.title | Dielectric Relaxation and Microstructures of SnO2 Doped CaCu3Ti4O12 Electroceramics Prepared Via Vibro-milling Method | |
| dc.type | Conference Paper |