Leakage current measurement with the bench test in watchdog timer power down mode for microcontroller device

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dc.contributor.authorParin Dechmunee
dc.contributor.authorPromphak Dawan
dc.contributor.authorWisut Titiroongruang
dc.contributor.authorNarin Atiwongsangthong
dc.date.accessioned2025-07-21T05:58:18Z
dc.date.issued2017-06-01
dc.identifier.doi10.1109/ecticon.2017.8096219
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/6514
dc.subjectTimer
dc.subjectDatasheet
dc.subjectTest bench
dc.subject.classificationIntegrated Circuits and Semiconductor Failure Analysis
dc.titleLeakage current measurement with the bench test in watchdog timer power down mode for microcontroller device
dc.typeArticle

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