Use of Neural Network to Model the Refractive Property of PECVD Silicon Nitride Films used to Prevent Water Permeability of Piezoresistive Pressure Sensor
| dc.contributor.author | Thongchai Thongvigitmanee | |
| dc.contributor.author | Arckom Srihapat | |
| dc.contributor.author | Charoenchai Khompatraporn | |
| dc.contributor.author | Adsada Jiraprayuklert | |
| dc.contributor.author | Wisut Titiroongruang | |
| dc.date.accessioned | 2025-07-21T05:51:18Z | |
| dc.date.issued | 2010-03-09 | |
| dc.identifier.doi | 10.1149/1.3360708 | |
| dc.identifier.uri | https://dspace.kmitl.ac.th/handle/123456789/2528 | |
| dc.subject | Passivation | |
| dc.subject | Piezoresistive effect | |
| dc.subject.classification | Semiconductor Lasers and Optical Devices | |
| dc.title | Use of Neural Network to Model the Refractive Property of PECVD Silicon Nitride Films used to Prevent Water Permeability of Piezoresistive Pressure Sensor | |
| dc.type | Article |