Microwave sensor for defected fruit classification

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dc.contributor.authorP. Leekul
dc.contributor.authorS. Chivapreecha
dc.contributor.authorM. Krairiksh
dc.date.accessioned2025-07-21T05:56:25Z
dc.date.issued2015-11-01
dc.identifier.doi10.1109/cama.2015.7428144
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/5459
dc.subjectMicrowave Imaging
dc.subject.classificationSpectroscopy and Chemometric Analyses
dc.titleMicrowave sensor for defected fruit classification
dc.typeArticle

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