Vision Inspection with K-Means Clustering on Head Gimbal Assembly Defect

Simple item page
dc.contributor.authorRawinun Praserttaweelap
dc.contributor.authorSomyot Kiatwanidvilai
dc.date.accessioned2025-07-21T05:55:42Z
dc.date.issued2015-01-01
dc.identifier.doi10.1007/978-3-319-19024-2_13
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/5045
dc.subjectFeature (linguistics)
dc.subject.classificationIndustrial Vision Systems and Defect Detection
dc.titleVision Inspection with K-Means Clustering on Head Gimbal Assembly Defect
dc.typeBook chapter

Files

Collections

All