Carrier Lifetime of Platinum Doped P-N Diode after Irradiation by Soft X-Ray

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dc.contributor.authorBudsara Nararug
dc.contributor.authorItsara Srithanachai
dc.contributor.authorSurada Ueamanapong
dc.contributor.authorSanya Khunkhao
dc.contributor.authorSupakorn Janprapha
dc.contributor.authorThanawat Thongnak
dc.contributor.authorNarin Atiwongsangthong
dc.contributor.authorSurasak Niemcharoen
dc.date.accessioned2025-07-21T05:53:58Z
dc.date.issued2013-07-01
dc.identifier.doi10.4028/www.scientific.net/amr.717.117
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/4056
dc.subjectPIN diode
dc.subject.classificationIntegrated Circuits and Semiconductor Failure Analysis
dc.titleCarrier Lifetime of Platinum Doped P-N Diode after Irradiation by Soft X-Ray
dc.typeArticle

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