Electronically tunable compact inductance simulator with experimental verification

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dc.contributor.authorBhardwaj, Kapil
dc.contributor.authorSrivastava, Mayank
dc.contributor.authorKumar, Anand
dc.contributor.authorSingh, Ramendra
dc.contributor.authorTangsrirat, Worapong
dc.date.accessioned2026-08-06T10:46:23Z
dc.date.available2026-08-06T10:46:23Z
dc.date.issued2024-06-01
dc.description.abstractA novel inductance simulation circuit employing only two dual-output voltage-differencing buffered amplifiers (DO-VDBAs) and a single capacitance (grounded) is proposed in this paper. The reported configuration is a purely resistor-less realization that provides electronically controllable realized inductance through biasing quantities of DO-VDBAs and does not rely on any constraints related to matched values of parameters. This structure exhibits excellent behavior under the influence of tracking errors in DO-VDBAs and does not exhibit instability at high frequencies. The simple and compact metal-oxide semiconductor (MOS) implementation of the DO-VDBAs (eight MOS per DO-VDBA) and adoption of grounded capacitance make the proposed circuit suitable for on-chip realization from the perspective of chip area consumption. The function of the pure grounded inductance is validated through high pass/bandpass filtering applications. To test the proposed design, simulations were performed in the PSPICE environment. Experimental validation was also conducted using the integrated circuit CA3080 and operational amplifier LF-356.
dc.identifier.citationETRI Journal, 46(3), 550-563, 2024
dc.identifier.doi10.4218/etrij.2023-0009
dc.identifier.issn12256463
dc.identifier.other2-s2.0-85159601686
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/15720
dc.sourceETRI Journal
dc.subjectCA3080
dc.subjectCMOS
dc.subjectDO-VDBA
dc.subjectelectronic tunability
dc.subjectinductor
dc.titleElectronically tunable compact inductance simulator with experimental verification
dc.typeArticle

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