Characterization of Sol-gel Derived Ti-doped Tungsten Oxide Electrochromic Thin Films

Abstract

Ti-doped WO3 electrochromic thin films were deposited onto F-doped tin oxide (FTO) substrates using spin coating technique. The as-deposited films prepared with various concentration of titanium were annealed in air at 500oC. The effect of Ti-doping concentration on structural, surface morphology and optical properties of the films were characterized by X-ray diffractometer, scanning electron microscope and UV-VIS spectrophotometer. The results show that the crystalline of WO3 can be identified at 2θ values of 24.14° corresponding to 200 orientation. In addition, It was found that the electrochromic performance of WO3 can be enhanced by small doping concentration of titanium due to structural modification of the films.