Improving Forward Current Characteristics of Diode by X-Ray Irradiation

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dc.contributor.authorSurasak Niemcharoen
dc.contributor.authorItsara Srithanachai
dc.contributor.authorSurada Ueamanapong
dc.contributor.authorAmporn Poyai
dc.date.accessioned2025-07-21T05:52:44Z
dc.date.issued2012-01-03
dc.identifier.doi10.4028/www.scientific.net/amr.433-440.6713
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/3350
dc.subjectEquivalent series resistance
dc.subject.classificationRadiation Effects and Dosimetry
dc.titleImproving Forward Current Characteristics of Diode by X-Ray Irradiation
dc.typeArticle

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