Improving the forward current of P-N diode using soft X-ray annealing method

Simple item page
dc.contributor.authorSurada Ueamanapong
dc.contributor.authorItsara Srithanachai
dc.contributor.authorAi-lada Suwanchatree
dc.contributor.authorSurasak Niemcharoen
dc.contributor.authorNipapan Klunngien
dc.contributor.authorAmporn Poyai
dc.date.accessioned2025-07-21T05:54:09Z
dc.date.issued2013-09-01
dc.identifier.doi10.1109/iscit.2013.6645875
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/4158
dc.subjectEquivalent series resistance
dc.subjectp�n junction
dc.subject.classificationIntegrated Circuits and Semiconductor Failure Analysis
dc.titleImproving the forward current of P-N diode using soft X-ray annealing method
dc.typeArticle

Files

Collections

All