Measurement of BCITL parameters

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dc.contributor.authorSuthasinee Lamultree
dc.contributor.authorDanai Torrungrueng
dc.contributor.authorChuwong Phongcharoenpanich
dc.date.accessioned2025-07-21T05:49:43Z
dc.date.issued2008-05-01
dc.identifier.doi10.1109/ecticon.2008.4600421
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/1619
dc.subject.classificationSemiconductor Lasers and Optical Devices
dc.titleMeasurement of BCITL parameters
dc.typeArticle

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