Limitation in thin-film sensing with transmission-mode terahertz time-domain spectroscopy
| dc.contributor.author | Withawat Withayachumnankul | |
| dc.contributor.author | John F. O�Hara | |
| dc.contributor.author | Wei Cao | |
| dc.contributor.author | Ibraheem Al-Naib | |
| dc.contributor.author | Weili Zhang | |
| dc.date.accessioned | 2025-07-21T05:54:32Z | |
| dc.date.issued | 2014-01-09 | |
| dc.description.abstract | In transmission-mode terahertz time-domain spectroscopy (THz-TDS), the thickness of a sample is a critical factor that determines an amount of the interaction between terahertz waves and bulk material. If the interaction length is too small, a change in the transmitted signal is overwhelmed by fluctuations and noise in the system. In this case, the sample can no longer be detected. This article presents a criterion to determine the lower thickness boundary of a free-standing film that can still be detectable by free-space transmission-mode THz-TDS. The rigorous analysis yields a simple proportional relation between the sample optical length and the system SNR. The proposed criterion can help to decide whether an alternative terahertz thin-film sensing modality is necessary. | |
| dc.identifier.doi | 10.1364/oe.22.000972 | |
| dc.identifier.uri | https://dspace.kmitl.ac.th/handle/123456789/4388 | |
| dc.subject | Terahertz time-domain spectroscopy | |
| dc.subject | Sample (material) | |
| dc.subject | SIGNAL (programming language) | |
| dc.subject.classification | Terahertz technology and applications | |
| dc.title | Limitation in thin-film sensing with transmission-mode terahertz time-domain spectroscopy | |
| dc.type | Article |