Limitation in thin-film sensing with transmission-mode terahertz time-domain spectroscopy

dc.contributor.authorWithawat Withayachumnankul
dc.contributor.authorJohn F. O�Hara
dc.contributor.authorWei Cao
dc.contributor.authorIbraheem Al-Naib
dc.contributor.authorWeili Zhang
dc.date.accessioned2025-07-21T05:54:32Z
dc.date.issued2014-01-09
dc.description.abstractIn transmission-mode terahertz time-domain spectroscopy (THz-TDS), the thickness of a sample is a critical factor that determines an amount of the interaction between terahertz waves and bulk material. If the interaction length is too small, a change in the transmitted signal is overwhelmed by fluctuations and noise in the system. In this case, the sample can no longer be detected. This article presents a criterion to determine the lower thickness boundary of a free-standing film that can still be detectable by free-space transmission-mode THz-TDS. The rigorous analysis yields a simple proportional relation between the sample optical length and the system SNR. The proposed criterion can help to decide whether an alternative terahertz thin-film sensing modality is necessary.
dc.identifier.doi10.1364/oe.22.000972
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/4388
dc.subjectTerahertz time-domain spectroscopy
dc.subjectSample (material)
dc.subjectSIGNAL (programming language)
dc.subject.classificationTerahertz technology and applications
dc.titleLimitation in thin-film sensing with transmission-mode terahertz time-domain spectroscopy
dc.typeArticle

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