Comparison of interferometer and d�nanoimager for profiling large objects (Conference Presentation)

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dc.contributor.authorDingfu Chen
dc.contributor.authorYingjie Yu
dc.contributor.authorJianfei Sun
dc.contributor.authorPrathan Buranasiri
dc.contributor.authorSutha Sutthiruangwong
dc.contributor.authorThanthanat Srisuwan
dc.contributor.authorAnand Asundi
dc.date.accessioned2025-07-21T06:02:15Z
dc.date.issued2019-09-10
dc.identifier.doi10.1117/12.2524704
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/8720
dc.subjectProfiling (computer programming)
dc.subjectPresentation (obstetrics)
dc.subject.classificationAdvanced Measurement and Metrology Techniques
dc.titleComparison of interferometer and d�nanoimager for profiling large objects (Conference Presentation)
dc.typeArticle

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