Effect of annealing process on the properties of undoped and manganese2+-doped co-binary copper telluride and tin telluride thin films

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dc.contributor.authorMeaunfun Kladkaew
dc.contributor.authorNorasate Samranlertrit
dc.contributor.authorVeeramol Vailikhit
dc.contributor.authorPichanan Teesetsopon
dc.contributor.authorAuttasit Tubtimtae
dc.date.accessioned2025-07-21T05:59:35Z
dc.date.issued2018-01-31
dc.identifier.doi10.1016/j.ceramint.2018.01.166
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/7242
dc.subjectOrthorhombic crystal system
dc.subjectTelluride
dc.subject.classificationChalcogenide Semiconductor Thin Films
dc.titleEffect of annealing process on the properties of undoped and manganese2+-doped co-binary copper telluride and tin telluride thin films
dc.typeArticle

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