XAFS analysis of indium oxynitride thin films grown on silicon substrates - K. Amnuyswat; C. Saributr; P. Thanomngam; A. Sungthong; S. Porntheeraphat; S. Sopitpan; J. Nukeaw (My University, 2012)
Keywords: Indium nitride; Wurtzite crystal structure; Silicon oxynitride; ZnO doping and properties