Investigation of optical characteristics of the evaporated Ta 2 O 5 thin films based on ellipsometry and spectroscopy - R. Prachachet; P. Buranasiri; M. Horprathum; P. Eiamchai; None S.Limwichean; V. patthanasettakul; None N.Nuntawong; P. Chindaudom; B. Samransuksamer; T. Lertvanithphol (My University, 2017)
Keywords: Ellipsometry; Spectrophotometry; Surface Roughness and Optical Measurements