Investigation of Oxygen Contamination in Indium Nitride Thin Film by X-Ray Absorption Fine Structure - K. Amnuyswat; Pitiporn Thanomngam; Suwat Sopitpan; A. Sungthong; Supanit Porntheeraphat; J. Nukeaw (My University, 2010)
Keywords: Wurtzite crystal structure; Indium nitride; Auger electron spectroscopy; XANES; GaN-based semiconductor devices and materials