Removing the transients electron trapping in P-N junction diode by using soft X-ray annealing method - Surada Ueamanapong; Itsara Srithanachai; Surasak Niemcharoen; Amporn Poyai (My University, 2014)
Keywords: pn junction; PIN diode; Deep-level transient spectroscopy; Integrated Circuits and Semiconductor Failure Analysis