A new model for predicting the effect of temperature and devices dimension on threshold voltage of PMOS in VLSI - A. Ruangphanit; A. Poyai; N. Sakuna; S. Niemcharoen; R. Muanghlua (My University, 2015)
Keywords: Negative-bias temperature instability; Temperature coefficient; Overdrive voltage; Advancements in Semiconductor Devices and Circuit Design