Reverse bias dependent impedance and dielectric properties of Al/n-NC FeSi2/p-Si/Pd heterostructures formed by facing-targets sputtering - Nattakorn Borwornpornmetee; Rawiwan Chaleawpong; Peerasil Charoenyuenyao; Adison Nopparuchikun; Boonchoat Paosawatyanyong; Phongsaphak Sittimart; Tsuyoshi Yoshitake; Nathaporn Promros (Materials Science in Semiconductor Processing, 2022)
Keywords: Semiconductor materials and interfaces; Semiconductor materials and devices; Anodic Oxide Films and Nanostructures