Extraction of mobility degradation, effective channel length and total series resistance of NMOS at elevated temperature - Kunagone Kiddee; Anucha Ruangphanit; Surasak Niemcharoen; Narin Atiwongsangthong; Rangson Muanghlua (My University, 2011)
Keywords: Transconductance; Equivalent series resistance; Degradation; Advancements in Semiconductor Devices and Circuit Design