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    Thermal image resolution on angular emissivity measurements using infrared thermography
    (2015-01-01)
    Nunak, T.
    ;
    Rakrueangdet, K.
    ;
    Nunak, N.
    ;
    Suesut, T.
    This paper reports the effect of viewing angle and thermal image resolution (IFOV and FOV) of Thermal Imager (TI) on the emissivity, with a view to providing a potential temperature monitoring of equipment in the electrical power distribution system which the reliability of system is the most important concern. The results show that the emissivity, which is the most important parameter to obtain the accurate temperature, is approximately constant at the viewing angle less than 45°. In case of the changing of the object to detector distance, this will not affect to the temperature measurement if MFOV at the object level is smaller than the targeted object. This can be concluded that TI is an effective tool to measure the temperature and monitor the failure of electrical equipment installed in the position at far away from the operator.
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    Surrounding effects on temperature and emissivity measurement of equipment in electrical distribution system
    (2015-01-01)
    Nunak, T.
    ;
    Nunak, N.
    ;
    Tipsuwanporn, V.
    ;
    Suesut, T.
    This paper reports the effect of surrounding conditions, e.g. IR radiation through IR window and the reflectivity and temperature of internal surface of chamber on the temperature and emissivity measurement. The results show that the transmission percentage of IR window is about 50 for all IR temperatures, except when the target temperature was the same as the surrounding temperature (T,ur). At this condition (Ts = Tc), the temperature readings were almost the same for all percentage of IR window. The accurate temperature measurement can be achieved by adjustment of the transmission correction in the IR camera or in the software. Considering the effect of materials surface and temperature of chamber, it can be concluded that the surrounding conditions can affect to the accurate emissivity measurement only with the high reflectance object, whereas the high emissivity object has no effect from the surround.
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    Item type:Publication,
    Emissivity estimation using thermographic camera
    (2013-11-04)
    Nunak, N.
    ;
    Roonprasang, K.
    ;
    Suesut, T.
    ;
    Nunak, T.
    This paper proposes a method based on the spectra response of IR detectors mounted on thermographic camera for emissivity measurement at various target surface temperatures, while the reflected temperature istaken into account, and also studies on the effect of surface roughness on the emissivity value. The emissivity (ε8-14μm) of general engineering material such as iron, stainless steel, brass, copper and aluminum obtained in this paper are in agreement with other literatures. Finally, results found that the roughness and emissivity of equipment increases with increasing of the operating time. © (2013) Trans Tech Publications, Switzerland.