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Emissivity estimation using thermographic camera

Author(s)
Nunak, N.
Roonprasang, K.
Suesut, T.
Nunak, T.
Date Issued
November 4, 2013
Type
Conference Paper
DOI
10.4028/www.scientific.net/AMR.811.380
Abstract
This paper proposes a method based on the spectra response of IR detectors mounted on thermographic camera for emissivity measurement at various target surface temperatures, while the reflected temperature istaken into account, and also studies on the effect of surface roughness on the emissivity value. The emissivity (ε8-14μm) of general engineering material such as iron, stainless steel, brass, copper and aluminum obtained in this paper are in agreement with other literatures. Finally, results found that the roughness and emissivity of equipment increases with increasing of the operating time. © (2013) Trans Tech Publications, Switzerland.
Citation
Advanced Materials Research, 811, 380-387, 2013
Subjects

Emissivity

Infrared thermography...

Thermographic camera

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