KMITL

Permanent URI for this communityhttps://dspace.kmitl.ac.th/handle/123456789/1

Browse

Settings

Author: search.filters.author.Mearnchu, J.

Search Results

Now showing 1 - 2 of 2
  • Loading...
    Thumbnail Image
    Some of the metrics are blocked by your 
    consent settings
    Item type:Publication,
    A handheld moisture content sensor using coupled-dipole antennas
    (2010-07-01)
    Mearnchu, J.
    ;
    Limpiti, T.
    ;
    Torrungrueng, D.
    ;
    Akkaraekthalin, P.
    ;
    Krairiksh, M.
    This paper presents an analysis and design of a handheld moisture content sensor. A dielectric property determination technique was used to measure the magnitudes of the reflection and the coupling coefficients of coupled-dipole antennas. These coefficients were plotted and their intersection determined to obtain the values of ε' <inf>r</inf> and ε" <inf>r</inf> (ε' <inf>r</inf> and ε" <inf>r</inf>, respectively, are the real and imaginary parts of the relative complex permittivity of the dielectric of interest). Moisture content measurements for paddy at various moisture content levels are shown. Comparison of measurements made by this technique with those made by conventional transmission measurement technique yielded a compensation scheme for error reduction. This sensor is useful for controlling the quality of paddy dried in a continuous microwave drying system process.
  • Loading...
    Thumbnail Image
    Some of the metrics are blocked by your 
    consent settings
    Item type:Publication,
    An inverse technique for dielectric-property determination from reflection measurement in spatial domain
    (2005-12-01)
    Mearnchu, J.
    ;
    Torrungrueng, D.
    ;
    Phongcharoenpanich, C.
    ;
    Krairiksh, M.
    An inverse technique by reflection measurement in spatial domain is proposed instead of frequency domain. A steepest descent algorithm is used for minimizing performance functions to obtain fast convergence. Comparison results of inverse technique in spatial domain provides good agreement to those obtained from frequency domain ones that shows the possibility to design a low cost dielectric-property determination system. ©2005 IEEE.