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    Item type:Publication,
    Influence of annealing temperature on optical properties of fluoride doped tin oxide films grown by the sol-gel spin-coating method
    (2016-10-12)
    Kahattha, C.
    ;
    Noonuruk, R.
    ;
    Pecharapa, W.
    Fluoride-doped Tin Oxide (FTO) thin films were deposited on glass and silicon substrates by the sol-gel spin-coating method using stannic chloride pentahydrate (SnCl<inf>4</inf>·5H<inf>2</inf>O) and ammonium fluoride (NH<inf>4</inf>F) as starting precursors for Sn and F sources. As-deposited films were annealed at different temperatures ranging from 300–600°C. The effect of annealing temperature on structural and optical properties of FTO thin films including crystallinity, surface morphology, optical transparency, optical reflectivity and optical band gap are investigated by X-ray diffraction, scanning electron microscopy and UV-VIS spectrophotometry. The XRD results suggest that the prominent peak in the (110) orientation can be indexed to the polycrystalline SnO<inf>2</inf> structure without any impurity phase caused by fluoride doping. The transmittance spectra of fluoride-doped tin oxide thin films show good transparency in the visible region with noticeable variation in its structural and optical reflectance properties depending on annealing temperature.