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Author: search.filters.author.Suzuki, Yasoji

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    A high-voltage generator with a VDC for TFT-LCDs
    (2001-12-01)
    Hayashi, Kentaro
    ;
    Suzuki, Yasoji
    ;
    Yoshida, Masahiro
    ;
    Thanachayanont, Apinunt
    ;
    Imai, Shigeki
    A high-voltage generator using a charge pumping circuit for TFT-LCD drivers has been already presented in IDW '99. The generator has a week point that the output voltage decreases as the driving output current increases. To solve this problem, a new high-voltage generator is proposed in this paper. The generator is composed of a charge pumping circuit and a VDC (Voltage Down Converter). The operating characteristics of the generator are also examined by using HSPICE in detail. And, it is demonstrated that the proposed generator can provide stable voltage for TFT-LCD drivers even at driving output current larger than 5mA.
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    New bias voltage generators for TFT-LCD's drivers
    (2000-01-01)
    Hirata, Manabu
    ;
    Suzuki, Yasoji
    ;
    Yoshida, Masahiro
    ;
    Arayashiki, Yutaka
    ;
    Teramoto, Mitsuo
    New positive and negative bias voltage generators for TFT-LCD's drivers utilizing charge pump circuits are introduced. The generators can generate positive or negative voltages with various amplitude by simply changing the number of pumping stages. By using the circuit simulation program HSPICE, it is demonstrated that the introduced generators can provide enough positive or negative voltages for TFT-LCD's drivers.
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    An efficient algorithm for circuit partitioning
    (1999-12-01)
    Yodtean, Apiradee
    ;
    Choomchuay, Somsak
    ;
    Suzuki, Yasoji
    This paper describes an improved simulated annealing algorithm applied for graph balanced bipartitioning problem, in particular for circuit partitioning problem. The new algorithm has incorporated the idea and procedure required in a genetic algorithm Experiment results on industrial benchmark circuits show that the proposed algorithm is superior to a conventional simulated annealing algorithm in both cut cost and run time.