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    Item type:Publication,
    Development and Testing of a High-Precision Current Transformer Terminal Inspection System
    (2026-01-01)
    Sripakarach, Panot
    ;
    Sreewirote, Bancha
    ;
    Songsukthawan, Panapong
    ;
    This paper presents the development and rigorous testing of an advanced current transformer (CT) terminal inspection system, signifying a major leap in electrical engineering diagnostics. Originating from the need to enhance the reliability and safety of electrical power systems, this system addresses the critical challenge of accurately identifying CT terminal conditions, which are fundamental for the proper functioning of protective relays and metering equipment. Utilizing state-of-the-art microcontroller and sensor technologies, the system precisely identifies the polarity and terminal configurations of CTs. A series of 20 trials were conducted on a varied selection of transformers, analyzing four crucial parameters: CT size and capacity, core material composition, turn ratio, and manufacturer-specific differences. The outcomes consistently highlighted the system’s superior diagnostic capabilities, accurately determining CT terminal conditions and polarity. The system’s design ensures efficient and safe operations, especially in complex and hazardous settings. These findings underscore the system’s reliability and robustness, indicating its potential as an indispensable tool for maintaining operational integrity and safety in various electrical applications. The successful development and validation of this system mark a notable advancement in the field, offering new avenues for enhanced diagnostics in electrical engineering.
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    Item type:Publication,
    An improved Current Voltage Transferring Device for high current high frequency measurement
    (2018-10-01) ;
    Kando, Masaaki
    This paper represents the characteristics of the improved Current Voltage Transferring Device (CVTD) for high current measurement including lightning impulse currents. The improved CVTD has been developed from the prototype CVTD to provide exceptional characteristics for high current with high frequency measurement. The improved CVTD in h-shaped configuration is made of copper and aluminium. The relationship between input current and output voltages of the new CVTD was investigated with short and long duration lightning impulse currents to establish the empirical formulas. The typical impulse current generator was used to generate 8/20 μs lightning impulse current with the amplitude of 940 A while the impulse generator with crowbar elements was utilized to generate 10/350 μs lightning impulse current with magnitude of 30.2 kA for the experiment. The lightning impulse current measurement characteristics of the CVTD and Rogowski coil were examined. From the experiments, the new improved CVTD shows the superior characteristics to measure the impulse currents with very fast rise time. Besides, nanosecond pulses superimposed on the lightning impulse currents were detected by only the improved CVTD. According to the experiments, there is no doubt that the new improved CVTD is a superior one for high current with high frequency measurement especially lightning impulse currents.
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    Item type:Publication,
    New current-voltage transferring device with different metals
    (2015-09-01)
    Kando, Masaaki
    ;
    A new concept of an electrical shunt with different materials (aluminum and copper) has been developed to be used as an alternative current measurement device. The device provides better current measurement characteristics compared with the conventional current measurement devices such as a shunt resistor with an ammeter or the multiple shunts consisting of molybdenum having a low temperature coefficient and a Rogowski coil with an integrated circuit. The currents in several electrical circuits have been measured using the developed current-voltage transferring device (CVTD) as voltages between the aluminum and copper elements. The measured voltages (V<inf>m</inf>) are proportional to measuring currents (I<inf>m</inf>), which is shown as the following the experimental equation V<inf>m</inf> [mV] =kI<inf>m</inf> [A], in which k is a coefficient depending on the configuration of the CVTD.
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