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An algorithm for circuit parameter identification in lightning impulse voltage generation for low-inductance loads
Author(s)
Date Issued
August 1, 2020
Type
Article
Abstract
This paper presents an effective technique based on an artificial neural network algorithm utilized for circuit parameter identification in lightning impulse generation for low inductance loads such as low voltage windings of a power transformer, a large distribution transformer and an air core reactor. The limitation of the combination between Glaninger’s circuit and the circuit parameter selection from Feser’s suggestions in term of producing an impulse waveform to be compliant with standard requirements when working with a low inductance load is discussed. In Feser’s approach, the circuit parameters of the generation circuit need to be further adjusted to obtain the waveform compliant with the standard requirement. In this process, trial and error approaches based on test engineers’ experience are employed in the circuit parameter selection. To avoid the unintentional damage from electrical field stress during the voltage waveform adjustment process, circuit simulators, such as Pspice and EMTP/ATP, are very useful to examine the generated voltage waveform before the experiments on the test object are carried out. In this paper, a system parameter identification based on an artificial neural network algorithm is applied to determine the appropriate circuit parameters in the test circuit. This impulse voltage generation with the selected circuit parameters was verified by simulations and an experiment. It was found that the generation circuit gives satisfactory impulse voltage waveforms in accordance with the standard requirement for the maximum charging capacitance of 10 µF and the load inductance from 400 µH to 4 mH. From the simulation and experimental results of all cases, the approach proposed in this paper is useful for test engineers in selection of appropriate circuit components for impulse voltage tests with low inductance loads instead of employing conventional trial and error in circuit component selection.
Citation
Energies, 13(15), 2020