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Optical properties and structure of copper (II) phthalocyanine(CuPc) organic thin film grown by electron - Beam evaporation technique
Author(s)
Date Issued
August 28, 2007
Type
Conference Paper
Abstract
Copper (II) Phthalocyanine (CuPc) thin films were grown by electron beam evaporation technique with various substrate temperatures. Crystalline of CuPc thin films was investigated by x-ray diffraction (XRD) spectroscopy. Diffraction pattern exhibit high quality crystalline films as monoclinic α-phase structure. Surface morphology of CuPc thin films was characterized by field emission electron microscope (FE-SEM) and the films grown with 150 °C substrate temperature illustrated nanorod-like structure. Absorption spectra were obtained by UV/Visible spectroscopy, revealed to Q-band and B-band. The transition energy of CuPc was characterized by photoreflectance spectroscopy (PR) correspond to an absorption peak of Q-band. © 2007 IEEE.
Citation
Proceedings of the 2nd IEEE International Conference on Nano Micro Engineered and Molecular Systems IEEE NEMS 2007, 764-767, 2007