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Chemical and dielectric study of PMMA/Montmorionite nano-composite films
Author(s)
Sirapanichart, Sanit
Khouchaf, Lahcen
Louarn, Guy
Elouadi, Brahim
Date Issued
January 1, 2010
Type
Conference Paper
Abstract
Tetrabutylphosphonium intercalated montmorillonite (P-MMT) was dispersed in toluene using sonication technique and a PMMA/toluene solution. The PMMA/P-MMT nano-suspension was then casted as a composite film on a glass plate, using spin coating technique with a rotation of 180 rpm. The composite films were characterized by various analytical techniques such as X-ray diffraction, X-ray fluorescence spectrometry thermo-gravimetric analysis, etc. The montmorillonite interlayer distance, estimated XRD results, was found to be equal to 1.6 nm. The PMMA/3 wt%P-MMT nano-composite film was found to completely decomposed at the temperature Td (PMMA/3 wt%P-MMT) = 370°C which is slightly higher than that of the neat PMMA, i.e. 365°C. It was also found that both plots of ε′r and ε″r versus frequency display equivalent behaviour. The optical absorption spectra show a rather large domain of transparency between 300 and 2700 nm, with a rather structured absorption band between 1700 and 2700 nm. Dielectric constant ranges near 1 to 3, depending on the frequency. This is very important for some electronic application, as underlined by former Authors. Copyright © 2010 Taylor & Francis Group, LLC.
Citation
Ferroelectrics, 402(1), 47-54, 2010