Degradation in electrical properties of Si-PIN Power diodes after treatment by electron irradiation

Thumbnail Image

Date

2013-09-01

Authors

Journal Title

Journal ISSN

Volume Title

Publisher

Abstract

Description

Keywords

Saturation current, Electron beam processing, Degradation, Reverse leakage current, PIN diode

Citation

URI

https://dspace.kmitl.ac.th/handle/123456789/4134

Collections

All

Endorsement

Review

Supplemented By

Referenced By