Repository logo
Communities & Collections
Research Outputs
Fundings & Projects
People
Statistics
New user? Click here to register.Have you forgotten your password?
  1. Home
  2. KMITL
  3. Publication
  4. Subthreshold operation of MOIS devices: Boundary of operation
Loading...
Thumbnail Image

Subthreshold operation of MOIS devices: Boundary of operation

Author(s)
Parnklang, Jirawath
Jindajitawat, Phumin
Titiroongruang, Wisut
Date Issued
December 1, 2000
Type
Conference Paper
Abstract
The boundary of MOIS operating in subthreshold are presented on this article. The MOS transistor-like structure is MOIS (Complementary Metal Oxide Intrinsic-like Semiconductor, MOIS), which prepared on gold-doped silicon. In this condition causes to change many essential characteristics of the device. We demonstrate the analytical parameters and the experimental result of the device which use to determine the subthreshold regime.
Citation
IEEE Region 10 Annual International Conference Proceedings TENCON, 3, I-25-I-28, 2000
Metrics
Get Involved!
  • Source Code
  • Documentation
  • Slack Channel
Make it your own

DSpace-CRIS can be extensively configured to meet your needs. Decide which information need to be collected and available with fine-grained security. Start updating the theme to match your Institution's web identity.

Need professional help?

The original creators of DSpace-CRIS at 4Science can take your project to the next level, get in touch!

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science

  • Accessibility settings
  • Privacy policy
  • End User Agreement
  • Send Feedback