XAFS analysis of indium oxynitride thin films grown on silicon substrates

Thumbnail Image

Date

2012-12-29

Authors

Journal Title

Journal ISSN

Volume Title

Publisher

Abstract

Description

Keywords

Indium nitride, Wurtzite crystal structure, Silicon oxynitride

Citation

URI

https://dspace.kmitl.ac.th/handle/123456789/3774

Collections

All

Endorsement

Review

Supplemented By

Referenced By