Carrier transportation properties and series resistance of n-type _-FeSi<sub>2</sub>/p-type Si heterojunctions fabricated by RF magnetron sputtering

Thumbnail Image

Date

2017-05-16

Authors

Journal Title

Journal ISSN

Volume Title

Publisher

Abstract

Description

Keywords

Equivalent series resistance, Cavity magnetron, Biasing

Citation

URI

https://dspace.kmitl.ac.th/handle/123456789/6459

Collections

All

Endorsement

Review

Supplemented By

Referenced By