Interface State Density and Series Resistance of <i>n</i>-Type Nanocrystalline FeSi<sub>2</sub>/<i>p</i>-Type Si Heterojunctions Formed by Utilizing Facing-Target Direct-Current Sputtering

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2017-10-17

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Nanocrystalline material, Equivalent series resistance, Ohmic contact

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https://dspace.kmitl.ac.th/handle/123456789/6806

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